2004 IEEE Radar Conference

Innovative Radar Technologies - Expanding System Capabilities

 
 
 April 26-29, 2004 Wyndham Philadelphia at Franklin Plaza Philadelphia, Pennsylvania
 
 
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Student Paper 1.1
Application of diffraction technology to UWB SAR research

Rui-Feng Xue - Department of Electronic Engineering, Shanghai Jiao Tong University, China, Bin Yuan - Department of Electronic Engineering, Shanghai Jiao Tong University, China, Jun-Fa Mao - Department of Electronic Engineering, Shanghai Jiao Tong University, China

Tue, 27 April 2004, 9:30 AM - 10:20 AM


Abstract

The application of diffraction technology to ultra wideband synthetic aperture radars (UWB SARs) was investigated to find an optimal solution to high-quality radar imagery. The microwave imagery criterion is presented and the spatial frequency coverage is introduced to evaluate imaging systems at first. Then radar imagery is analyzed with the comprehensive consideration of the scattering mechanisms, the data acquisition system, and the image reconstruction algorithm. Theoretical and numerical results show UWB SAR exploiting diffraction technology has the potential to realize high-resolution geometric imaging and probe inherent physical properties of targets. This will provide a theoretical basis for formation flight and optimization of SAR systems.

Bios

Mr. Rui-Feng Xue - Department of Electronic Engineering, Shanghai Jiao Tong University, China

Rui-Feng Xue was born in 1977. He received the B. S. degree in communication engineering from Taiyuan University of Technology, China, in 1999, and the M. S. degree in electronic engineering from Shanghai University, China, in 2002. He is currently working toward the Ph. D. degree in electronic engineering at Shanghai Jiao Tong University, China. His research interests include microstrip antennas, MIC & MMIC, and microwave imaging.

Dr. Bin Yuan - Department of Electronic Engineering, Shanghai Jiao Tong University, China

Bin Yuan received the B.Sc. and Ph.D. degrees from Xi'an Jiao Tong University, P.R.China, in 1989 and 1996, respectively. He did his postdoctoral research in field of electronics and communication in Xidian University from 1996 to 1999. He became a researcher in Tokyo, Japan in 1999. He is currently an associate professor in Shanghai Jiao Tong University. His research interests include solutions to Maxwell equations, experimental measurements in electromagnetism, microwave tomography, electromagnetic wave in the plasma and its applications.

Dr. Jun-Fa Mao - Department of Electronic Engineering, Shanghai Jiao Tong University, China

Jun-Fa Mao was born in 1965. He received the B. S. degree in nuclear radiation physics from the University of Science and Technology of National Defense, China, in 1985; the M. S. degree in experimental nuclear physics from the Shanghai Institute of Nuclear Research, Academic Sinica, China, 1988, and the Ph.D degree in electronic engineering from Shanghai Jiao Tong University, China, in 1992. Since 1992, he has been a Faculty Member of the Department of Electronic Engineering, Shanghai Jiao Tong University. He is now a professor and the Associated Dean of the School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University. He was a visiting Scholar in the Chinese University of Hong Kong, Hong Kong,from May 1994 to May 1995, and a postdoctoral researcher in the University of California at Berkeley,USA, from Sept. 1995 to Aug. 1996. His research interests include the signal integrity of high-speed integrated circuits, and microwave circuits on silicon substrate. He has published more than sixty journal papers(12 papers on IEEE Transactions) and a co-authored book. Dr. Mao is a senior member of IEEE, a Cheung Kong Scholar of Ministry of Education, CHINA.

 
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